Abstract
We present two novel mobile reflectometry approaches for acquiring detailed spatially varying isotropic surface reflectance and mesostructure of a planar material sample using commodity mobile devices. The first approach relies on the integrated camera and flash pair present on typical mobile devices to support free-form handheld acquisition of spatially varying rough specular material samples. The second approach, suited for highly specular samples, uses the LCD panel to illuminate the sample with polarized second-order gradient illumination. To address the limited overlap of the front facing camera’s view and the LCD illumination (and thus limited sample size), we propose a novel appearance transfer method that combines controlled reflectance measurement of a small exemplar section with uncontrolled reflectance measurements of the full sample under natural lighting. Finally, we introduce a novel surface detail enhancement method that adds fine scale surface mesostructure from close-up observations under uncontrolled natural lighting. We demonstrate the accuracy and versatility of the proposed mobile reflectometry methods on a wide variety of spatially varying materials.
We present two novel mobile reflectometry approaches for acquiring detailed spatially varying isotropic surface reflectance and mesostructure of a planar material sample using commodity mobile devices. The first approach relies on the integrated camera and flash pair present on typical mobile devices to support free-form handheld acquisition of spatially varying rough specular material samples. The second approach, suited for highly specular samples, uses the LCD panel to illuminate the sample with polarized second-order gradient illumination. To address the limited overlap of the front facing camera’s view and the LCD illumination (and thus limited sample size), we propose a novel appearance transfer method that combines controlled reflectance measurement of a small exemplar section with uncontrolled reflectance measurements of the full sample under natural lighting. Finally, we introduce a novel surface detail enhancement method that adds fine scale surface mesostructure from close-up observations under uncontrolled natural lighting. We demonstrate the accuracy and versatility of the proposed mobile reflectometry methods on a wide variety of spatially varying materials.